Authors

Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus

Conference

IEEE International Memory Workshop - IMW

Title

Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

Publication type

Proceedings paper