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Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

dc.contributor.authorGoux, Ludovic
dc.contributor.authorHurkx, Fred
dc.contributor.authorWang, Xin Peng
dc.contributor.authorDelhougne, Romain
dc.contributor.authorAttenborough, Karen
dc.contributor.authorGravesteijn, Dirk
dc.contributor.authorWouters, Dirk
dc.contributor.authorPerez Gonzalez, Jesus
dc.date.accessioned2021-10-18T16:40:09Z
dc.date.available2021-10-18T16:40:09Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17175
dc.sourceIIOimport
dc.titleExtraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method
dc.typeProceedings paper
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage33
dc.source.endpage36
dc.source.conferenceIEEE International Memory Workshop - IMW
dc.source.conferencedate16/05/2010
dc.source.conferencelocationSeoul Korea
imec.availabilityPublished - imec


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