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A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories
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Authors
Goux, Ludovic
;
Hurkx, Fred
;
Wang, Xin Peng
;
Delhougne, Romain
;
Attenborough, Karen
;
Gravesteijn, Dirk
;
Wouters, Dirk
;
Perez Gonzalez, Jesus
ISSN
0741-3106
Issue
11
Journal
IEEE Electron Device Letters
Volume
31
Title
A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories
Publication type
Journal article
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