Authors

Griffoni, Alessio; Chen, Shih-Hung; Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Groeseneken, Guido

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Charged device model (CDM) ESD challenges for laterally diffused nMOS (nLDMOS) silicon controlled rectifier (SCR) devices for high-voltage applications in standard low-voltage CMOS technology

Publication type

Proceedings paper

Embargo date

9999-12-31