Publication:
Short course FEOL reliability: BTI and TDDB in high k/metal gate, FinFET and Ge-based technologies
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1786 since deposited on 2021-10-18
4last month
Acq. date: 2026-02-25
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Statistics
Views
1786 since deposited on 2021-10-18
4last month
Acq. date: 2026-02-25
Citations