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Degradation and failure analysis of copper and tungsten contacts under high fluence stress
Publication:
Degradation and failure analysis of copper and tungsten contacts under high fluence stress
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Date
2010
Proceedings Paper
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21476.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kauerauf, Thomas
;
Butera, Geni
;
Croes, Kristof
;
Demuynck, Steven
;
Wilson, Chris
;
Roussel, Philippe
;
Drijbooms, Chris
;
Bender, Hugo
;
Lofrano, Melina
;
Vandevelde, Bart
;
Tokei, Zsolt
;
Groeseneken, Guido
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1967
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1967
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-11
Citations