Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs

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Authors

Kilchytska, V.; Alvarado, J.; Collaert, Nadine; Rooyackers, Rita; Militaru, O.; Berger, G.; Flandre, D.

ISSN

0018-9499

Issue

4

Journal

IEEE Transactions on Nuclear Science

Volume

57

Title

Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs

Publication type

Journal article

Embargo date

9999-12-31

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