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dc.contributor.authorKobayashi, Shinji
dc.contributor.authorShimura, Satoru
dc.contributor.authorKawasaki, Tetsu
dc.contributor.authorNafus, Kathleen
dc.contributor.authorHatakeyama, Shinichi
dc.contributor.authorShite, Hideo
dc.contributor.authorNishimura, Eiichi
dc.contributor.authorKushibiki, Masato
dc.contributor.authorHara, Arisa
dc.contributor.authorGronheid, Roel
dc.contributor.authorVaglio Pret, Alessandro
dc.contributor.authorKitano, Junichi
dc.date.accessioned2021-10-18T17:44:58Z
dc.date.available2021-10-18T17:44:58Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17391
dc.sourceIIOimport
dc.titleLWR reduction by novel lithographic and etch techniques
dc.typeProceedings paper
dc.contributor.imecauthorNafus, Kathleen
dc.contributor.imecauthorGronheid, Roel
dc.contributor.imecauthorVaglio Pret, Alessandro
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage763914
dc.source.conferenceAdvances in Resist Materials and Processing Technology XXVII
dc.source.conferencedate21/02/2010
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings SPIE; Vol.7639


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