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Towards the understanding of resistive contrast imaging in in situ dielectric breakdown studies using a nanoprober setup
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Towards the understanding of resistive contrast imaging in in situ dielectric breakdown studies using a nanoprober setup
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrinou, Konstantza
;
Hantschel, Thomas
;
Arstila, Kai
;
Kleindiek, Stephan
;
Rummel, Andreas
;
Tokei, Zsolt
;
Croes, Kristof
;
Pantouvaki, Marianna
;
Czarnecki, Piotr
;
De Wolf, Ingrid
;
Vandervorst, Wilfried
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1887
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Acq. date: 2026-01-08
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Metrics
Views
1887
since deposited on 2021-10-18
2
last month
1
last week
Acq. date: 2026-01-08
Citations