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Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions

dc.contributor.authorLuque Rodriguez, A.
dc.contributor.authorJimenez Tejada, J.A.
dc.contributor.authorRodriguez-Bolivar, S.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-18T18:34:12Z
dc.date.available2021-10-18T18:34:12Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17539
dc.sourceIIOimport
dc.titleModeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions
dc.typeProceedings paper
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage384
dc.source.endpage387
dc.source.conference40th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate14/09/2010
dc.source.conferencelocationSevilla Spain
imec.availabilityPublished - open access


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