Preliminary reliability at 50 V of State-of-the-art RF power GaN-on-Si HEMTs

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Authors
Medjdoub, Farid; Marcon, Denis; Das, Jo; Derluyn, Joff; Cheng, Kai; Degroote, Stefan; Germain, Marianne; Decoutere, Stefaan
Conference
68th Annual Device Research Conference - DRC
Title
Preliminary reliability at 50 V of State-of-the-art RF power GaN-on-Si HEMTs
Publication type
Proceedings paper
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