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3D Integration: Circuit design, test and reliability challenges

dc.contributor.authorMinas, Nikolaos
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorStucchi, Michele
dc.contributor.authorOprins, Herman
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorVelenis, Dimitrios
dc.contributor.authorMarchal, Pol
dc.date.accessioned2021-10-18T19:09:19Z
dc.date.available2021-10-18T19:09:19Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17633
dc.sourceIIOimport
dc.title3D Integration: Circuit design, test and reliability challenges
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorOprins, Herman
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorVelenis, Dimitrios
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecOprins, Herman::0000-0003-0680-4969
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage217
dc.source.conference16th IEEE International On-Line Testing Symposium - IOLTS
dc.source.conferencedate5/07/2010
dc.source.conferencelocationCorfu Greece
dc.identifier.urlhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5560201
imec.availabilityPublished - open access


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