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Noise as a spectroscopic tool for semiconductor characterization

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-30T08:00:42Z
dc.date.available2021-09-30T08:00:42Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1773
dc.sourceIIOimport
dc.titleNoise as a spectroscopic tool for semiconductor characterization
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage324
dc.source.endpage341
dc.source.conferenceDiagnostic Techniques for Semiconductor Materials and Devices
dc.source.conferencedate4/05/1997
dc.source.conferencelocationMontréal Canada
imec.availabilityPublished - open access
imec.internalnotesECS Proceedings; Vol. 97-12


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