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Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arrays
Publication:
Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arrays
Date
2010-03
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Poliakov, Pavel
;
Blomme, Pieter
;
Miranda Corbalan, Miguel
;
Anchlia, Ankur
;
Dobrovolny, Petr
;
Brusamarello, Lucas
;
Stucchi, Michele
;
Van Houdt, Jan
;
Dehaene, Wim
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1871
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1871
since deposited on 2021-10-18
3
last week
Acq. date: 2025-10-30
Citations