Publication:
Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
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1942 since deposited on 2021-10-18
1last month
Acq. date: 2026-04-26
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Views
1942 since deposited on 2021-10-18
1last month
Acq. date: 2026-04-26
Citations