Authors

Sahhaf, Sahar; Degraeve, Robin; Srividya, Vidya; Cho, Moon Ju; Kauerauf, Thomas; Groeseneken, Guido

Conference

48th Annual IEEE International Reliability Physics Symposium- IRPS

Title

Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors

Publication type

Proceedings paper

Embargo date

9999-12-31