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Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
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1950 since deposited on 2021-10-18
Acq. date: 2026-04-28
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Statistics
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1950 since deposited on 2021-10-18
Acq. date: 2026-04-28
Citations