Authors

Sahhaf, Sahar; Degraeve, Robin; Srividya, Vidya; Kaczer, Ben; Gealy, Dan; Horiguchi, Naoto; Togo, Mitsuhiro; Hoffmann, Thomas Y.; Groeseneken, Guido

ISSN

0741-3106

Issue

4

Journal

IEEE Electron Device Letters

Volume

31

Title

Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density

Publication type

Journal article

Embargo date

9999-12-31