Publication:
Profiling different kind of generated defects at elevated temperatures in both SiO2 and high-k dielectrics
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1931 since deposited on 2021-10-18
Acq. date: 2026-01-09
Citations
Metrics
Views
1931 since deposited on 2021-10-18
Acq. date: 2026-01-09
Citations