Authors

Sarkar, Deblina; Thijs, Steven; Linten, Dimitri; Russ, Christian; Gossner, Harald; Banerjee, Kaustav

Conference

IEEE International Electron Devices Meeting - IEDM

Title

A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices

Publication type

Proceedings paper

Embargo date

9999-12-31