Show simple item record

High-temperature characterization of advanced strained nMUGFETs

dc.contributor.authorTalmat, Rachida
dc.contributor.authorPut, Sofie
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorClaeys, Cor
dc.contributor.authorGuo, W.
dc.contributor.authorCretu, B.
dc.contributor.authorBenfdila, A.
dc.contributor.authorRoutoure, J.-M.
dc.contributor.authorCarin, R.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-18T22:12:33Z
dc.date.available2021-10-18T22:12:33Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18068
dc.sourceIIOimport
dc.titleHigh-temperature characterization of advanced strained nMUGFETs
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference6th Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
dc.source.conferencedate25/01/2010
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record