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Innovative characterization techniques for ultra-scaled FinFETs
Publication:
Innovative characterization techniques for ultra-scaled FinFETs
Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tettamanzi, G.C.
;
Lansbergen, G.P.
;
Verduijn, J.
;
Rahman, R.
;
Paul, A.
;
Lee, S.
;
Collaert, Nadine
;
Biesemans, Serge
;
Klimeck, G.
;
Rogge, S.
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1848
since deposited on 2021-10-18
Acq. date: 2025-10-22
Citations
Metrics
Views
1848
since deposited on 2021-10-18
Acq. date: 2025-10-22
Citations