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Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBellens, Rudi
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T12:41:46Z
dc.date.available2021-09-29T12:41:46Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/180
dc.sourceIIOimport
dc.titleUnderstanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage103
dc.source.endpage115
dc.source.conferenceProceedings of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF
dc.source.conferencedate4/10/1994
dc.source.conferencelocationGlasgow UK
imec.availabilityPublished - open access


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