dc.contributor.author | Van Besien, Els | |
dc.contributor.author | Pantouvaki, Marianna | |
dc.contributor.author | Zhao, Larry | |
dc.contributor.author | De Roest, David | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Beyer, Gerald | |
dc.date.accessioned | 2021-10-18T22:50:06Z | |
dc.date.available | 2021-10-18T22:50:06Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18151 | |
dc.source | IIOimport | |
dc.title | Influence of porosity on electrical properties of low-k dielectrics | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Van Besien, Els | |
dc.contributor.imecauthor | Pantouvaki, Marianna | |
dc.contributor.imecauthor | De Roest, David | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.orcidimec | Van Besien, Els::0000-0002-5174-2229 | |
dc.source.peerreview | no | |
dc.source.conference | Advanced Metallization Conference - AMC | |
dc.source.conferencedate | 5/10/2010 | |
dc.source.conferencelocation | Albany, NY USA | |
imec.availability | Published - imec | |