dc.contributor.author | Van Look, Lieve | |
dc.contributor.author | Bekaert, Joost | |
dc.contributor.author | Laenens, Bart | |
dc.contributor.author | Vandenberghe, Geert | |
dc.contributor.author | Richter, Jan | |
dc.contributor.author | Bubke, Karsten | |
dc.contributor.author | Peters, Jan Hendrik | |
dc.contributor.author | Schreel, Koen | |
dc.contributor.author | Dusa, Mircea | |
dc.date.accessioned | 2021-10-18T23:09:56Z | |
dc.date.available | 2021-10-18T23:09:56Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18193 | |
dc.source | IIOimport | |
dc.title | Experimental study of effect of pellicle on optical proximity fingerprint for 1.35 NA immersion ArF lithography | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van Look, Lieve | |
dc.contributor.imecauthor | Bekaert, Joost | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.contributor.imecauthor | Dusa, Mircea | |
dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 76401Y | |
dc.source.conference | Optical Microlithography XXIII | |
dc.source.conferencedate | 21/02/2010 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE; Vol.7640 | |