Authors

Vandelli, Luca; Arreghini, Antonio; Padovani, Andrea; Larcher, Luca; Van den Bosch, Geert; Della Marca, Vincenzo; Pavan, Paolo; Jurczak, Gosia; Van Houdt, Jan

Conference

48th Annual IEEE International Reliability Physics Symposium - IRPS

Title

Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability

Publication type

Proceedings paper