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Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
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Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandelli, Luca
;
Arreghini, Antonio
;
Padovani, Andrea
;
Larcher, Luca
;
Van den Bosch, Geert
;
Della Marca, Vincenzo
;
Pavan, Paolo
;
Jurczak, Gosia
;
Van Houdt, Jan
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1991
since deposited on 2021-10-18
Acq. date: 2025-12-10
Citations
Metrics
Views
1991
since deposited on 2021-10-18
Acq. date: 2025-12-10
Citations