dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Koelling, Sebastian | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Douhard, Bastien | |
dc.date.accessioned | 2021-10-18T23:24:58Z | |
dc.date.available | 2021-10-18T23:24:58Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18225 | |
dc.source | IIOimport | |
dc.title | Quantitative observation of Ge-segregation during the Si-passivation of Ge-surfaces. | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Douhard, Bastien | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | MRS Spring Meeting Symposium I: Materials for End-of-Roadmap Scaling of CMOS | |
dc.source.conferencedate | 5/04/2010 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |