Show simple item record

Material assessment for uni-axial strained Ge pMOS -1: characterization of GeSn(B) materials

dc.contributor.authorVincent, Benjamin
dc.contributor.authorShimura, Yosuke
dc.contributor.authorTakeuchi, Shotaro
dc.contributor.authorNishimura, Tsuyoshi
dc.contributor.authorDemeulemeester, Jelle
dc.contributor.authorEneman, Geert
dc.contributor.authorClarysse, Trudo
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorVantomme, Andre
dc.contributor.authorNakatsuka, Osamu
dc.contributor.authorZaima, Shigeaki
dc.contributor.authorDekoster, Johan
dc.contributor.authorCaymax, Matty
dc.contributor.authorLoo, Roger
dc.date.accessioned2021-10-19T00:03:40Z
dc.date.available2021-10-19T00:03:40Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18305
dc.sourceIIOimport
dc.titleMaterial assessment for uni-axial strained Ge pMOS -1: characterization of GeSn(B) materials
dc.typeOral presentation
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorDekoster, Johan
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceWorkshop: GeSn Developments and Future Applications
dc.source.conferencedate28/05/2010
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record