Cleaning and surface preparation for SiGe and Ge channel device
dc.contributor.author | Wada, M | |
dc.contributor.author | Takahashi, H | |
dc.contributor.author | Snow, J | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Shirakawa, H | |
dc.date.accessioned | 2021-10-19T00:10:56Z | |
dc.date.available | 2021-10-19T00:10:56Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18320 | |
dc.source | IIOimport | |
dc.title | Cleaning and surface preparation for SiGe and Ge channel device | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.source.peerreview | no | |
dc.source.beginpage | 7.3 | |
dc.source.conference | 10th International Symposium on Ultra-Clean Processing of Semiconductor Devices - UCPSS | |
dc.source.conferencedate | 20/09/2010 | |
dc.source.conferencelocation | Oostende Belgium | |
imec.availability | Published - imec |
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