dc.contributor.author | Wiaux, Vincent | |
dc.contributor.author | Wong, Patrick | |
dc.contributor.author | Vandenbroeck, Nadia | |
dc.contributor.author | Bekaert, Joost | |
dc.contributor.author | Laenens, Bart | |
dc.contributor.author | De Bisschop, Peter | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Vandenberghe, Geert | |
dc.date.accessioned | 2021-10-19T00:25:55Z | |
dc.date.available | 2021-10-19T00:25:55Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18350 | |
dc.source | IIOimport | |
dc.title | Multiple patterning: step by step towards 1X nm hp | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wiaux, Vincent | |
dc.contributor.imecauthor | Wong, Patrick | |
dc.contributor.imecauthor | Vandenbroeck, Nadia | |
dc.contributor.imecauthor | Bekaert, Joost | |
dc.contributor.imecauthor | De Bisschop, Peter | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.contributor.orcidimec | Wong, Patrick::0000-0003-3605-9680 | |
dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | International Symposium on Lithography Extensions | |
dc.source.conferencedate | 20/10/2010 | |
dc.source.conferencelocation | Kobe Japan | |
imec.availability | Published - open access | |
imec.internalnotes | e-proceedings Sematech-website | |