Authors

Decoutere, Stefaan; Simoen, Eddy; Vancuyck, Geert; Deferm, Ludo; Claeys, Cor

Conference

Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

Title

A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors

Publication type

Proceedings paper

Embargo date

9999-12-31