Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

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Authors
Zhang, Cher Xuan; Zhang, E. Xia; Fleetwood, Dan M.; Schrimpf, Ronald D; Galloway, Kenneth F.; Simoen, Eddy; Mitard, Jerome; Claeys, Cor
Conference
11th European Conference on Radiation and its Effects on Components and Systems - RADECS
Title
Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs
Publication type
Proceedings paper
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