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Theory of hole mobility in strained Ge and III-V p-channel inversion layers with high-kappa insulators
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Authors
Zhang, Yan
;
Fischetti, Massimo
;
Soree, Bart
;
O'Regan, Terrance
ISSN
0021-8979
Issue
12
Journal
Journal of Applied Physics
Volume
108
Title
Theory of hole mobility in strained Ge and III-V p-channel inversion layers with high-kappa insulators
Publication type
Journal article
Embargo date
9999-12-31
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