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Interface trap characterization of a 5.8-Å EOT p-MOSFET using high frequency on-chip ring oscillator charge pumping technique
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Authors
Cho, Moon Ju
;
Kaczer, Ben
;
Aoulaiche, Marc
;
Degraeve, Robin
;
Roussel, Philippe
;
Franco, Jacopo
;
Kauerauf, Thomas
;
Ragnarsson, Lars-Ake
;
Hoffmann, Thomas Y.
;
Groeseneken, Guido
ISSN
0018-9383
Issue
10
Journal
IEEE Transactions on Electron Devices
Volume
58
Title
Interface trap characterization of a 5.8-Å EOT p-MOSFET using high frequency on-chip ring oscillator charge pumping technique
Publication type
Journal article
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