Publication:
Interface trap characterization of a 5.8-Å EOT p-MOSFET using high frequency on-chip ring oscillator charge pumping technique
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1893 since deposited on 2021-10-19
3last month
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Acq. date: 2026-01-10
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1893 since deposited on 2021-10-19
3last month
2last week
Acq. date: 2026-01-10
Citations