Authors

Chung, Eun-Ae; Nam, Kab-Jin; Kim, Young-Pil; Min, Ji-Young; Cho, Moon Ju; Hong, Hyungseok; Han, Jeong; Lee, Jae-Duk; Shin, Yu-Gyun; Choi, Siyoung; Kim, Sangsig

ISSN

1293-2558

Issue

6

Journal

Solid State Sciences

Volume

13

Title

Investigation of spatial and energetic trap distributions in 1 nm EOT SiO2/HfO2 by discharging-sweep mode amplitude charge pumping

Publication type

Journal article