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Investigation of spatial and energetic trap distributions in 1 nm EOT SiO2/HfO2 by discharging-sweep mode amplitude charge pumping
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1906 since deposited on 2021-10-19
Acq. date: 2026-01-10
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Views
1906 since deposited on 2021-10-19
Acq. date: 2026-01-10
Citations