Radiation hardness of SiGe and Ge-based CMOS technologies

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Authors
Claeys, Cor; Iacvo, C.; Mitard, Jerome; Arora, R.; Zhang, C.; Galloway, K.; Fleetwood, D.; Schrimpf, R.; Poizat, M.; Simoen, Eddy
Conference
26th Symposium on Microelectronics Technology and Devices - SBMicro
Title
Radiation hardness of SiGe and Ge-based CMOS technologies
Publication type
Proceedings paper
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