Authors

Crupi, Felice; Alioto, Massimo; Franco, Jacopo; Magnone, Paolo; Kaczer, Ben; Groeseneken, Guido; Mitard, Jerome; Witters, Liesbeth; Hoffmann, Thomas Y.

Conference

IEEE International Symposium on Circuits and Systems - ISCAS

Title

Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling

Publication type

Proceedings paper