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On-chip circuit for massively parallel BTI characterization
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Authors
da Silva, Mauricio Banasheski
;
Kaczer, Ben
;
Van der Plas, Geert
;
Wirth, Gilson I.
;
Groeseneken, Guido
Conference
IEEE International Integrated Reliability Workshop - IIRW
Title
On-chip circuit for massively parallel BTI characterization
Publication type
Proceedings paper
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