dc.contributor.author | De Bisschop, Peter | |
dc.contributor.author | Laenens, Bart | |
dc.contributor.author | Iwase, Kazuya | |
dc.contributor.author | Yao, Teruyoshi | |
dc.contributor.author | Dusa, Mircea | |
dc.contributor.author | Smayling, M. | |
dc.date.accessioned | 2021-10-19T13:02:53Z | |
dc.date.available | 2021-10-19T13:02:53Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18774 | |
dc.source | IIOimport | |
dc.title | Joint optimization of layout and litho for SRAM and Logic towards the 20 nm node, using 193i | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Bisschop, Peter | |
dc.contributor.imecauthor | Dusa, Mircea | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 79730B | |
dc.source.conference | Optical Microlithography XXIV | |
dc.source.conferencedate | 27/02/2011 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE; Vol.7973 | |