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dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorLofrano, Melina
dc.contributor.authorJansen, Roelof
dc.contributor.authorRottenberg, Xavier
dc.contributor.authorSeveri, Simone
dc.contributor.authorBorremans, Jonathan
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorDonnay, Stephane
dc.contributor.authorTilmans, Harrie
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-19T13:03:48Z
dc.date.available2021-10-19T13:03:48Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18779
dc.sourceIIOimport
dc.titleA novel test method for simultaneous measurement of thermal conductivity, CTE, residual stress and Young's modulus of suspended thin films using a laser Doppler vibrometer
dc.typeProceedings paper
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorLofrano, Melina
dc.contributor.imecauthorJansen, Roelof
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorTilmans, Harrie
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecJansen, Roelof::0000-0001-6685-4699
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.contributor.orcidimecTilmans, Harrie::0000-0003-4240-4962
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewyes
dc.source.conference16th International Conference on Solid-State sensors, Actuators and Microsystems - Transducers
dc.source.conferencedate5/06/2011
dc.source.conferencelocationBeijing China
imec.availabilityPublished - imec


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