dc.contributor.author | de Souza, M. | |
dc.contributor.author | Pavanello, M.A. | |
dc.contributor.author | Martino, J.A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-19T13:07:31Z | |
dc.date.available | 2021-10-19T13:07:31Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18799 | |
dc.source | IIOimport | |
dc.title | Impact of substrate rotation and temperature on the mobility and series resistance of triple-gate SOI nMOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 223 | |
dc.source.endpage | 230 | |
dc.source.conference | 26th Symposium on Microelectronics Technology and Devices - SBMicro | |
dc.source.conferencedate | 30/08/2011 | |
dc.source.conferencelocation | Joao Pessoa Brazil | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Transactions; Vol. 39, Issue 1 | |