Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Impact of substrate rotation and temperature on the mobility and series resistance of triple-gate SOI nMOSFETs
Publication:
Impact of substrate rotation and temperature on the mobility and series resistance of triple-gate SOI nMOSFETs
Copy permalink
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Souza, M.
;
Pavanello, M.A.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
Description
Statistics
Views
1840
since deposited on 2021-10-19
1
last month
Acq. date: 2026-02-27
Citations
Statistics
Views
1840
since deposited on 2021-10-19
1
last month
Acq. date: 2026-02-27
Citations