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Impact of substrate rotation and temperature on the mobility and series resistance of triple-gate SOI nMOSFETs
Publication:
Impact of substrate rotation and temperature on the mobility and series resistance of triple-gate SOI nMOSFETs
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Souza, M.
;
Pavanello, M.A.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
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1838
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations
Metrics
Views
1838
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations