Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Automation of DfT insertion and interconnect test generation for 3D stacked ICs
Publication:
Automation of DfT insertion and interconnect test generation for 3D stacked ICs
Copy permalink
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deutsch, Sergej
;
Chickermane, Vivek
;
Keller, Brion
;
Konijnenburg, Mario
;
Marinissen, Erik Jan
Journal
Abstract
Description
Statistics
Views
1985
since deposited on 2021-10-19
1
last month
Acq. date: 2026-08-04
Citations
Statistics
Views
1985
since deposited on 2021-10-19
1
last month
Acq. date: 2026-08-04
Citations