Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices

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Authors
El-Mamouni, F.; Zhang, E.X.; Schrimpf, R.D.; Reed, R.A.; Galloway, K.F.; McMorrow, D.; Simoen, Eddy; Claeys, Cor; Cristoloveanu, S.; Xiong, W.
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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