Show simple item record

Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices

dc.contributor.authorEl-Mamouni, F.
dc.contributor.authorZhang, E.X.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.A.
dc.contributor.authorGalloway, K.F.
dc.contributor.authorMcMorrow, D.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorCristoloveanu, S.
dc.contributor.authorXiong, W.
dc.date.accessioned2021-10-19T13:24:11Z
dc.date.available2021-10-19T13:24:11Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18877
dc.sourceIIOimport
dc.titlePulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage882
dc.source.endpage885
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access
imec.internalnotesSE.4.1


Files in this item

Thumbnail
Name:
23043.pdf
Size:
919.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record