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Understanding EUV resist dissolution characteristics and its impact to RLS limitations
Publication:
Understanding EUV resist dissolution characteristics and its impact to RLS limitations
Date
2011
Proceedings Paper
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22435.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fonseca, Carlos
;
Head, Brian H.
;
Shite, Hideo
;
Nafus, Kathleen
;
Gronheid, Roel
;
Winroth, Gustaf
Journal
Abstract
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1961
since deposited on 2021-10-19
434
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1961
since deposited on 2021-10-19
434
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations