Authors

Franco, Jacopo; Kaczer, Ben; Eneman, Geert; Roussel, Philippe; Cho, Moon Ju; Mitard, Jerome; Witters, Liesbeth; Hoffmann, Thomas Y.; Groeseneken, Guido

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

On the recoverable and permanent components of hot carrier and NBTI in Si pMOSFETs and their implications in Si0.45Ge0.55 pMOSFETs

Publication type

Proceedings paper

Embargo date

9999-12-31