Publication:
On the recoverable and permanent components of hot carrier and NBTI in Si pMOSFETs and their implications in Si0.45Ge0.55 pMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1804 since deposited on 2021-10-19
1last month
1last week
Acq. date: 2026-10-04
Citations
Statistics
Views
1804 since deposited on 2021-10-19
1last month
1last week
Acq. date: 2026-10-04
Citations