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Analytical Electron Microscopy of Si1-xGex/Si Heterostructures and Local Isolation Structures
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Authors
Armigliato, A.
;
Balboni, R.
;
Corticelli, F.
;
Frabboni, S.
;
Malvezzi, F.
;
Vanhellemont, Jan
Conference
1st International Conference on Materials for Microelectronics; October 17-19, 1994; Barcelona, Spain.
Title
Analytical Electron Microscopy of Si1-xGex/Si Heterostructures and Local Isolation Structures
Publication type
Oral presentation
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