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Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions

dc.contributor.authorGriffoni, Alessio
dc.contributor.authorZuber, Paul
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorRoussel, Philippe
dc.contributor.authorLinten, Dimitri
dc.contributor.authorAlles, Michael L.
dc.contributor.authorSchrimpf, Ronald D.
dc.contributor.authorReed, Robert A.
dc.contributor.authorKobayashi, Daisuke
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T14:00:08Z
dc.date.available2021-10-19T14:00:08Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19011
dc.sourceIIOimport
dc.titleImpact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
dc.typeProceedings paper
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage195
dc.source.endpage201
dc.source.conferenceEuropean Conference on Radiation Effects on Component and Systems - RADECS
dc.source.conferencedate19/09/2011
dc.source.conferencelocationSevilla Spain
imec.availabilityPublished - imec


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