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Extreme-ultraviolet secondary electron blur at the 22-nm half pitch node
Publication:
Extreme-ultraviolet secondary electron blur at the 22-nm half pitch node
Date
2011
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gronheid, Roel
;
Younkin, Todd
;
Leeson, Michael J.
;
Fonseca, Carlos
;
Hooge, Joshua S.
;
Nafus, Kathleen
;
Biafore, John J.
;
Smith, Mark D.
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
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1953
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1953
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations