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Analytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure

dc.contributor.authorHabas, Predrag
dc.date.accessioned2021-09-30T08:22:39Z
dc.date.available2021-09-30T08:22:39Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1913
dc.sourceIIOimport
dc.titleAnalytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage605
dc.source.endpage610
dc.source.conference21st International Conference on Microelectronics - MIEL
dc.source.conferencedate14/09/1997
dc.source.conferencelocationNis Yugoslavia
imec.availabilityPublished - open access


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